Estimating the Process Sigma Level Based on Information from Statistical Process Control or Process Capability Analysis

Authors

  • Milan Terek School of Management

DOI:

https://doi.org/10.12776/qip.v30i1.2335

Keywords:

process sigma level, critical-to-quality characteristic, defect, defect opportunity

Abstract

Purpose: The article proposes an approach to estimating the process sigma level based on information from statistical process control or process capability analysis.

Methodology/Approach: The z-score for each critical-to-quality characteristic and for the overall process is estimated from the data obtained in statistical process control or process capability analysis.

Findings: The proposed procedure for estimating the sigma level offers several advantages over the traditional method.

Research Limitation/Implication: We assume that each critical-to-quality characteristic is linked to only one type of defect opportunity, which can result in only one defect of that type on a single unit. We only consider continuous, normally distributed, and nominal critical-to-quality characteristics with two possible values: non-defective and defective.

Originality/Value of paper: The proposed procedure enables us to use information from statistical process control and process capability analysis to estimate the process sigma level and provides additional valuable insights into the process.

Author Biography

  • Milan Terek, School of Management

    Prof., School of Management

References

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Published

2026-04-30

Issue

Section

Articles

How to Cite

Estimating the Process Sigma Level Based on Information from Statistical Process Control or Process Capability Analysis. (2026). Quality Innovation Prosperity, 30(1), 24-37. https://doi.org/10.12776/qip.v30i1.2335